The 22nd Annual IEEE Workshop on Microelectronics and Electron Devices (WMED) will provide a forum for reviewing and discussing all aspects of micro- and nano-electronics, including processing, electrical characterization, design, and new device technologies. This workshop will consist of invited and contributed talks, papers, and a daily poster session. Faculty, students, and industry researchers are encouraged to contribute papers on either completed research or work in progress.
Topics in the following areas will form the contributing sessions and poster sessions in the workshop:
Trends in submicron CMOS technology, product development (DRAM, SRAM, Flash, CMOS Imagers), new device technologies (phase change memory, resistive memory, ferroelectric memory), novel transistors, process technology enabling artificial intelligence systems
Novel processes, materials and device characterization on nanotubes, nanowires, quantum dots, molecular devices, MEMS research
Dielectric reliability, device reliability, novel memory technology testing schemes
Semiconductor package reliability, design for manufacturability, stacked die packaging and novel assembly processes
New product design, AI/ML-assisted design, high-speed and low-power design techniques and system architectures and memory sensing schemes
Emerging hardware security threats and vulnerabilities, security-related topics in microelectronic device design and integration, nanoelectronic devices, MEMS, and packaging
High Bandwidth Memory (Advanced System Architecture, Design, Performance, Integration Challenges, Reliability, and Testing) and In-Memory Computing (Architectures for AI & machine learning, Energy efficiency, performance trade-offs, Emerging applications, and future trends)
AI-Enhanced Hardware Design and Optimization, AI for Hardware Security and Threat Mitigation, AI in Nanoelectronics Devices and MEMS, and AI-Integrated Semiconductor Testing and Reliability
An IEEE Publication of the accepted papers and a USB Flash drive, including the papers and presentations, are planned and will be available at the start of the workshop. Submitted manuscripts must follow the IEEE publication format guidelines. A template containing manuscript preparation instructions can be downloaded here
Please submit your IEEE-formatted manuscript (up to 4 pages) by January 21, 2025, using easychair .For any queries regarding submission, please reach out to the WMED 2025 Publications Chair, John Chaka(john.chaka@siemens.com). The Technical Program Committee will have a peer-review process to meet the IEEE criterion for minimum publication quality standards. Inquiries can be directed to Sandeep Chalamalasetty (IEEE WMED 202 General Chair, sivanagasundeep@gmail.com).
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